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Synthetic Polymeric Membranes: Characterization by Atomic Force Microscopy

Posted By : sreetech | Date : 09 Aug 2009 15:39:20 | Comments : 0 |
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K.C. Khulbe, C.Y. Feng, T. Matsuura, "Synthetic Polymeric Membranes: Characterization by Atomic Force Microscopy"
Springer; 1 edition (January 2008) | ISBN : 3540739939 | 216 pages | PDF | 4,7 Mb

This book concentrates on the method recently developed to study the surfaces of synthetic polymeric membranes using an Atomic Force Microscope (AFM). AFM is becoming a very important tool for the characterization of synthetic polymeric membranes. The development of membranes for improved performance depends on the exact knowledge of the morphology of a thin selective layer that exists at the surface of the membrane.The control of the morphology of the selective layer is crucial for the design of synthetic polymeric membranes. With a relatively short history of twenty-five years, AFM has firmly established its position as a means of characterizing the membrane surface.

This book is well-suited for academic researchers who are investigating synthetic membranes, as well as R&D staff who wish to improve and control the quality of synthetic membranes for various purposes, and is also of interest to a wider range of readers, as synthetic membranes are now considered to be one of the most important tools in the areas of seawater desalination, waste-water treatment, water production, food processing, treatment of pharmaceutical products, air and water purification, separation of chemical and petrochemical products, drug release and other biomedical applications.

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